Non-Destructive Inspection of Electronics Using Computed Tomography (CT)
Non-Destructive Inspection of Electronics Using Computed Tomography (CT)
How important is electricity? Our power grid has the responsibility of ensuring our businesses and homes are reliably heated, cooled, and lit. The electronics that run the grid are designed with low failure rates, but defects can still appear. These defects are difficult to detect without destroying the product. Schweizer Engineering Laboratories (SEL) has sponsored our team to use X-ray images to allow non-destructive inspection of their electronics.
Attend Our Technical Presentation
3:30 p.m. Friday, April 29 – Session 6
Team Members
Wesley Gates - Mechanical Engineering
Dustin Taylor - Mechanical Engineering
Tiana Black - Mechanical Engineering
Cory Summers - Computer Science
Davey Anguiano - Computer Science
Client/Sponsor
Alex Olson - Schweitzer Engineering Laboratories
Sally Mei - Schweitzer Engineering Laboratories
Faculty Advisor
Michael Maughan - U of I Department of Mechanical Engineering
Meet Us at EXPO April 29
Booth Number: 24
Join us in-person 9 a.m.-12 p.m. April 29 in the Idaho Central Credit Union Arena on the Moscow campus during our annual Engineering Design EXPO! Browse all student team booths. Maps are available on-site.